发明名称 BACKLASH CORRECTION METHOD FOR SURFACE ANALYZER
摘要 PURPOSE:To dispense with the previous measurement of a backlash when the result of surface analysis through the reciprocation of a sample is displayed on a cathode-ray tube or the like, by making it possible to adjust the phase or wave form of an x-axis deflection signal for the display, relative to a forward or backward-stroke video signal obtained by the reciprocative scanning of the sample. CONSTITUTION:In correcting the deviation of an image, the width of a luminous spot erasure signal S is adjusted while watching the faceplate of a cathode-ray tube, to change the time point of start of the rise in an x-axis deflection signal B to move the forward-stroke image rightward or leftward to overlay the image on the backward-stroke image. In other words, the wave form of the deflection signal B, a reference wave form for which is shown by a one-dot chain line in the drawing, is modified as shown by a full line therein. The counting of reading clock pulses is started at the time of the fall in a reading signal R. When a prescribed number of the reading clock pulses is counted, the count is cleared. The luminous spot erasure signal S of negative level is applied for the period from the start of the counting to the clearing of the count to erase a luminous line signal.
申请公布号 JPS62202447(A) 申请公布日期 1987.09.07
申请号 JP19860044356 申请日期 1986.02.28
申请人 SHIMADZU CORP 发明人 ZENITANI FUKUO
分类号 G01N23/22;G02B21/26;H01J37/20;H01J37/22;H01J37/252 主分类号 G01N23/22
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