发明名称 COMPOSITION ANALYSIS OF MATERIAL BY X RAYS
摘要 PURPOSE:To make online analysis of a material to be measured without moving an X-ray source, X-ray detector, optical system, etc., by projecting the transmit ted X-ray after transmission through the material to be measured to plural single crystals and spectrally splitting the same in >=2 kinds of monochromatic X-rays. CONSTITUTION:The X-ray source 1 is so disposed as to irradiate the prescribed X-ray toward the material 2 to be measured under rotation in a direction W. The white X-ray beam emitted from the X-ray source 1 is spectrally divided by a collimator 3 and is irradiated to the material 2. One of the while X-ray beam subjected to the spectral division is the X-ray (a) passing the center of the materials 2 from the X-ray source 1 and the other one is the X-ray (b) with the included angle of the X-ray (a) as alpha. Collimators 4 are provided in alignment to the optical axes of the X-rays (a), (b) on the rear side of the material 2 to prevent the influence of the noise by the scattered X-ray, etc., from the material 2. On the other hand, the X-rays (a), (b) after the transmission are diffracted by the single crystals 5a, 5b and are spectrally divided to >=2 kinds of the monochromatic X-rays like low and high energies EL, EH. The X-ray quantities thereof are measured with X-ray detectors 6a, 6b.
申请公布号 JPS62201340(A) 申请公布日期 1987.09.05
申请号 JP19860043735 申请日期 1986.02.28
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 KOMURA YUKIO;KOAIZAWA HISASHI
分类号 G01N23/06 主分类号 G01N23/06
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