发明名称 METHOD OF PRODUCING A CONTACT FOR A SEMICONDUCTOR DEVICE
摘要 A method of producing a semiconductor device comprising the steps of: forming a window or contact hole in an insulating layer to expose a portion of a semiconductor substrate or a lower conductor line; forming semiconductor material (silicon) in the window; substituting the material with a metal (tungsten) by reaction of the semiconductor material with a metal compound (WF6 gas); and forming a conductor line over the metal within the window.
申请公布号 EP0164976(A3) 申请公布日期 1987.09.02
申请号 EP19850303878 申请日期 1985.05.31
申请人 FUJITSU LIMITED 发明人 SHIOYA, YOSHIMI;FURUMURA, YUJI;OHYAMA, YASUSHI;INOUE, SHIN-ICHI;OGAWA, TSUTOMU;WATANABE, KIYOSHI;GOTO, HIROSHI
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L29/45;(IPC1-7):H01L21/60;H01L23/48 主分类号 H01L21/28
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