发明名称 |
Method of forming vertically integrated current source |
摘要 |
A current source MOSFET is fabricated by forming a trench (36) in an n++ drain (source) region (32) and extending below the trench (36). A gate oxide layer (40) is disposed on the sidewalls of the trench (36) and a conductive region (38) formed in the bottom of the trench (36). A gate-to-source (gate-to-drain) contact (49) is then formed in the trench (36) and then a drain (source) contact (58) formed. The vertical gate structure defines a vertical channel region on all sides of the trench (36) to allow a wider devive to be fabricated in a smaller overall silicon area.
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申请公布号 |
US4689871(A) |
申请公布日期 |
1987.09.01 |
申请号 |
US19850779748 |
申请日期 |
1985.09.24 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MALHI, SATWINDER D. S. |
分类号 |
H01L21/336;H01L29/423;H01L29/78;(IPC1-7):H01L21/302;H01L21/441 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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