发明名称 TESTING METHOD FOR STORAGE CIRCUIT
摘要 PURPOSE:To execute a failure analysis as accurately recognizing the difference in the nature of the failure occurring due to the presence/absence of a redundancy circuit by detecting a location where the redundancy circuit is used, and outputting the decision-result as to said location and that of a location where the redundancy circuit is not used respectively in different formats. CONSTITUTION:A test in which a voltage, a timing, a test pattern, etc. are supplied to a storage circuit to be tested and a decision is made on the output, is executed to obtain a failure information under given conditions. Thereafter, the information about whether the redundancy circuit is used in the storage circuit to be tested is obtained, and when the circuit is used, the information about what address the circuit is used in is obtained. Then, the failure- information stored in a memory device for failure-information is read out, and whether or not the failed part is the part replaced by the redundancy circuit is checked. When said checked part is a one not replaced thatwise, a normal failure-output is outputted to an output medium. But in case of a part replaced thatwise, the output is outputted in a format different from a normal one.
申请公布号 JPS62195799(A) 申请公布日期 1987.08.28
申请号 JP19860037087 申请日期 1986.02.20
申请人 NEC CORP 发明人 ISHIGURO HIDEO
分类号 G01R31/316;G01R31/28;G11C29/00;G11C29/44 主分类号 G01R31/316
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