发明名称 METHOD AND APPARATUS FOR IMPROVED MONITORING AND DETECTION OF IMPROPER DEVICE OPERATION
摘要 A method and apparatus is disclosed for the improved monitoring and detection of improper device operation. Operation of a prototype device is first modeled. In particular, a set of test vectors is selected to provide a desired degree of testing of the prototype unit. The expected response of the prototype to the selected set of test vectors is determined through the use of analytical prediction means, and stored for subsequent comparison with the operation of the prototype unit. Thereafter, the selected set of test vectors are applied to the prototype unit, and the response thereto compared in real time with the expected responses. Improper operation of the prototype device is thereby identified, and associate information recorded for subsequent analysis.
申请公布号 EP0176854(A3) 申请公布日期 1987.08.26
申请号 EP19850111701 申请日期 1985.09.16
申请人 TEKTRONIX, INC. 发明人 TALLMAN, JAMES L.
分类号 G06F11/22;G01R31/3193;G06F11/26;G06F11/34 主分类号 G06F11/22
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