发明名称 VERTICALLY ISOLATED COMPLEMENTARY TRANSISTOR STRUCTURES
摘要 A process for making complementary transistor devices in an epitaxial layer of a first conductivity type having a deep vertical isolation sidewall between the N and P channel transistors by providing a backfilled cavity in the epitaxial layer, the sidewalls of the cavity being coated with layers of material, the first layer being a silicate doped with the same conductivity type as the epitaxial layer in contact with the epitaxial layer and overcoated with an isolation and diffusion barrier layer, the second silicate layer doped to a conductivity opposite to that of the first layer and isolated therefrom by said isolation and diffusion barrier material. The cavity is backfilled with semiconductor material of a conductivity type opposite to that of the epitaxial layer and during this backfilling operation the dopants in the first and second layer outdiffuse into the epitaxial layer and into the backfill material respectfully to prevent the creations of parasitic channels.
申请公布号 EP0190581(A3) 申请公布日期 1987.08.19
申请号 EP19860100564 申请日期 1986.01.17
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABERNATHEY, JOHN ROBERT;KOBURGER III, CHARLES WILLIAM
分类号 H01L27/08;H01L21/20;H01L21/225;H01L21/76;H01L21/762;H01L29/78;(IPC1-7):H01L21/76 主分类号 H01L27/08
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