发明名称 AUTOMATIC MEASURING INSTRUMENT FOR THICKNESS OF ROLLING LINE
摘要 <p>PURPOSE:To obtain a rolling line with high responsiveness and an automatic thickness measuring instrument without off-set caused by thickness deviation by comprising a control system as one loop transfer function without a minor loop for the automatic measuring instrument which measures the thickness of a rolling line with the aid of X-rays. CONSTITUTION:The deviation of a current thickness value 9 from a target thickness 1 is converted into draft position from a waste time 2 until a material reaches a thickness gauge 12 from a rolling mill 14, an influence coefficient A3 and the transfer coefficient of a conversion gain 4, and the draft position 13 is handled as one transfer function. Thus the responsiveness of an X- RAY.AGC, which is conventionally controlled by a draft position control loop, is improved. The aim of control is shifted to thickness, and therefore the conventional off-set for the deviation of thickness is eliminated.</p>
申请公布号 JPS62189503(A) 申请公布日期 1987.08.19
申请号 JP19860030438 申请日期 1986.02.14
申请人 MITSUBISHI ELECTRIC CORP 发明人 AZUMA SANEMITSU
分类号 G05D5/02;B21B37/16;B21B37/18;G05B11/36 主分类号 G05D5/02
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