发明名称 PATTERN CHECKER FOR CONDUCTIVE THIN FILM
摘要 PURPOSE:To enable a quick and accurate pattern inspection, by checking a pattern on a glass plate with measuring pins in contact with the pattern. CONSTITUTION:A glass plate being conveying by a conveying device 21 is stopped with a stopper 37 and the glass plate is placed on a stage 23 as separated from the device 21. The glass plate is positioned at a specified checking position by pressing it on the stage 23 on reference rollers 44-46 with a gauging 47. After positioned, the glass plate is sucked securely on the stage 23 and a measuring pin 52 provided on a measuring head 24 is brought into contact with the pattern on the glass plate to check. Therefore, the measuring pin 52 contacts a pattern at a point to reduce the checking time of the pattern substantially. This can also make the contact pressure of the measuring pin 52 the same thereby stabilizing measurement.
申请公布号 JPS62188978(A) 申请公布日期 1987.08.18
申请号 JP19860030266 申请日期 1986.02.14
申请人 TOSHIBA CORP 发明人 SAKAMI YOSHITAKE
分类号 G09F9/00;G01R31/02;G02F1/13 主分类号 G09F9/00
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