| 摘要 |
PURPOSE:To accurately identify a place where a device deteriorates by constituting a system so that test condition is settable for each package unit in the device, and evaluating the characteristics of the device while changing conditions. CONSTITUTION:Parameters which cause deterioration are changed, package by package, and controlled to measure the tolerance of device characteristics. Namely, test parameters (e.g. source voltage, noise quantity, etc.) are supplied to a circuit package 3 of a device unit to be tested from a test condition setting device 1 through a supply line 5. The output 6 of the device 2 to be tested is inputted to a characteristic evaluating device 4 to evaluate characteristics such as a code error rate. Packages are changed with a changeover switch 7 and the parameters are varied in value to check the influence of them upon the characteristics of the device 2, measuring the operation tolerance of each package.
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