发明名称 TEST SYSTEM FOR MEMORY AREA
摘要 PURPOSE:To check the presence or absence of a fault of a memory area like a test block instruction and then to process an initialization instruction, etc., at high speed, by attaining the detection of the fault as soon as a designated memory area is initialized. CONSTITUTION:When initialization is carried out for the detection of the fault of a memory area, a test mode latch 11 is set and a write request is delivered for initialized data. A partial writing action is forcibly carried out after the latch 11 is set and the data on the designated memory area is read out. This data and the initialized data are merged with each other and written to the corresponding memory area. here the write flag showing the write byte position is set at all 1 and all bytes of the designated memory area are initialized. While the presence or absence of a fault is checked with the read-out data. Thus it is possible to perform simultaneously both initialization of the designated memory area and detection of faults with just a single write request. Then an initialization instruction can be processed at high speed.
申请公布号 JPS62180440(A) 申请公布日期 1987.08.07
申请号 JP19860021833 申请日期 1986.02.03
申请人 HITACHI LTD 发明人 HIBI KAZUO;SHIMOJO TAKASHI;WATABE YASUO;FUJITA AKIRA
分类号 G06F12/16 主分类号 G06F12/16
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