<p>Projection measurements are made of the transmitted x-ray beam in low and high energy regions. These are combined in a non-linear processor to produce atomic-number-dependent and density-dependent projection information. This information is used to provide cross-sectional images which are free of spectral-shift artifacts and completely define the specific material properties.</p>
申请公布号
DE2733586(C2)
申请公布日期
1987.08.06
申请号
DE19772733586
申请日期
1977.07.26
申请人
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY, STANFORD, CALIF., US
发明人
ALVAREZ, ROBERT EDWARD, MOUNTAIN VIEW, CALIF., US;MACOVSKI, ALBERT, MENLO PARK, CALIF., US
