发明名称 SUBSTRATE INSPECTION MACHINE
摘要 PURPOSE:To shorten the processing time of a substrate by moving a carrying unit which has two substrate holding mechanism reciprocally in a substrate carrying direction. CONSTITUTION:The carrying unit 800 which has load-side and unload-side chuck parts 802 and 806 as the two substrate holding mechanisms is reciprocated in the substrate carrying direction to supply a substrate to an inspection stage and discharge a substrate from the stage 200 at the same time. Then, while the stage 200 inspects a substrate, a substrate to be inspected next is held on one substrate holding mechanism of the unit 800, so the supply of a substrate to the stage 200 and the discharge of a substrate from the stage 200 are carried out efficiently in a short time. Further, the halt time of inspecting operation for the supply and discharge of substrates can be shortened, so the total substrate processing speed is improved.
申请公布号 JPS62177458(A) 申请公布日期 1987.08.04
申请号 JP19860018110 申请日期 1986.01.31
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 KAGEYAMA MITSUAKI;TAJIMA SUMIO;YAMAHA TSUNEO
分类号 G01R31/02 主分类号 G01R31/02
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