发明名称 MEASURING METHOD FOR TEMPERATURE AND DENSITY OF GAS
摘要 PURPOSE:To enable simultaneous measurement of temperature and density of a gas keeping intact the condition during the reaction without suction and collection, by employing a semiconductor laser as light source to generate an infrared rays with a large power within a narrow wavelength range. CONSTITUTION:A temperature controller 3 and a current controller 2 are control so that a semiconductor laser 1 will oscillate upto a desired wavelength. Then, a measuring light and reference light divided by a half mirror 5 are inputted into a data processing section 11 as a measuring signal and a reference signal respectively. The processing section 11 computes transmissivity of the measuring light from the measuring signal and the reference signal. Also a sweep current value is inputted into a processing section 11 from the current controller and from the relationship between a sweep current and an oscillation wavelength of a laser 1, the processing section 11 computes the oscillation wavelength of the laser 1 using the sweep current value. In this manner, the temperature and density of a gas can be measured simultaneously keeping intact the condition during the reaction without suction and collection.
申请公布号 JPS62175648(A) 申请公布日期 1987.08.01
申请号 JP19860019023 申请日期 1986.01.29
申请人 SUMITOMO METAL IND LTD 发明人 HIRAMOTO KAZUO;YAMAMOTO TOSHIYUKI
分类号 G01K11/12;G01K13/02;G01N21/39 主分类号 G01K11/12
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