TEST PROBE ASSEMBLY FOR IC CHIPS,申请号EP19840302479-传众专利搜索

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发明名称	TEST PROBE ASSEMBLY FOR IC CHIPS
摘要
申请公布号	EP0127295(B1)	申请公布日期	1987.07.29
申请号	EP19840302479	申请日期	1984.04.11
申请人	WENTWORTH LABORATORIES, INC.	发明人	EVANS, ARTHUR
分类号	H01L21/66;G01R1/073;(IPC1-7):G01R1/073	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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