Integrated circuit test clip

摘要

The present invention relates to a connection system between an integrated circuit, encapsulated in a "chip carrier with perimetric connections" or ceramic "MICOP", and the dynamic testing devices (for example between a microprocessor and a logic analyzer). This system of connection is a test chip which is formed of an insulating body comprising at its periphery a number of test contacts equal to the number of inputs-outputs of the MICOP installed or not in its connector. Locking levers pivotably mounted to the body provide locking of the test clip. Finally, a printed circuit fixed to the insulating body allows wiring of the connection cable to the test clip.