| 摘要 |
A temperature detecting device detects infrared rays from an object to be measured and determines the temperature of the object based on the detection result. To avoid the influence of contamination adhered to the infrared ray incident surface of an infrared ray detecting unit, a correction coefficient for the detection result of the infrared ray detecting unit is determined before actual temperature detecting starts. For this purpose, the infrared rays fed from the object into the infrared ray detecting unit are interrupted by a shutter device. The infrared ray detecting unit detects the infrared rays fed from the shutter device through the infrared ray incident surface, and it outputs a first detection value corresponding to the shutter temperature. A shutter temperature detecting element directly detects the actual temperature of the shutter device, and it outputs a second detection value corresponding to the actual temperature of the shutter device. The correction coefficient is determined by comparing the second detection value from the shutter temperature detecting element with the first detection value from the infrared ray detecting unit. Subsequently detected temperatures are then corrected by this correction coefficient. |
