| 摘要 |
PURPOSE:To surely carry out a general test on an inter-trunk circuit terminal equipment test adapter by giving a delay on a par with the case where a sub scriber line terminal equipment is viewed from an exchange side, folding an information bit expressing the signal of an information message as it is and folding a control bit after it is converted into any values. CONSTITUTION:An PM decoder circuit 11 and an PM encoder circuit 16 are provided, between which AND gates 12 and 12', OR gates 13 and 13', a switch 17 capable of switching the outputs of signals '1' and '0', a state bit specifica tion switch group 18 which switches the control bit to any values so as to fold, a delay circuit 14 on a par with an OCE using a clock of 4mHz, and a delay circuit 15 equivalent to an SLT obtained by subtracting a delay amount in the OCE with the aid of a clock of 8mHz are provided. The information bit is folded as it is, whereas the control bit is converted into any values within a fixed range. Therefore such a general test on an OCE test adapter can be surely carried out that the trouble of a state bit detector in the OCE test adapt er and that of the set place of the control bit are pinpointed.
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