发明名称 BASICITY INTENSITY MEASUREMENT OF SOLID SURFACE
摘要 <p>PURPOSE:To enable quantitative measurement of basicity intensity of a solid surface in a wide range, by making a phenol compound having an electron attracting substituent absorbed at para-position on a solid surface to monitor the wave number absorbing infrared rays corresponding to expansion and contraction vibration of the electron attracting substituent. CONSTITUTION:After a phenol compound having an electron attracting substituent is adsorbed at a para-position on a solid surface, the wave number absorbing infrared rays corresponding to measure the expansion and contraction vibration of the electron attracting substituent. The phenol compound, for example, 4'-hydroxy acetophenon is an acid easy to dissociate and therefore allows an acid-base reaction with any basic point at various solid surfaces. According to the intensity of the base, the wave number of C=o expansion and contraction vibration at acetyl group changes according to the intensity of the base and 4'-hydroxy acetophenon also is enhanced in the electron donating property with a progress in the phenolation so much by a strong base to shifts the wave number of C=o expansion and contraction vibration toward the low number side. Thus, the basicity intensity of a solid surface can be determined from the wave number of the phenol compound adsorbed on the solid surface by previously checking the correlation between the pKa of the base and the wave number.</p>
申请公布号 JPS62163948(A) 申请公布日期 1987.07.20
申请号 JP19860005745 申请日期 1986.01.14
申请人 KAO CORP 发明人 HOTTA HAJIME
分类号 G01N21/35;G01N21/3563 主分类号 G01N21/35
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