发明名称 |
Long wavelength X-ray diffractometer. |
摘要 |
<p>A long wavelength diffractometer is provided with an X-ray tube providing long wavelength radiation to a pre-sample monochromometer which diffracts X-radiation onto a sample. The use of long wavelength X-radiation allows measurement of "d" values of about 2 times greater than normal with very low intrinsic background.</p> |
申请公布号 |
EP0228747(A2) |
申请公布日期 |
1987.07.15 |
申请号 |
EP19860202319 |
申请日期 |
1986.12.18 |
申请人 |
NORTH AMERICAN PHILIPS CORPORATION |
发明人 |
JENKINS, RONALD;NICOLOSI, JOSEPH |
分类号 |
G01N23/207 |
主分类号 |
G01N23/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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