发明名称 Long wavelength X-ray diffractometer.
摘要 <p>A long wavelength diffractometer is provided with an X-ray tube providing long wavelength radiation to a pre-sample monochromometer which diffracts X-radiation onto a sample. The use of long wavelength X-radiation allows measurement of "d" values of about 2 times greater than normal with very low intrinsic background.</p>
申请公布号 EP0228747(A2) 申请公布日期 1987.07.15
申请号 EP19860202319 申请日期 1986.12.18
申请人 NORTH AMERICAN PHILIPS CORPORATION 发明人 JENKINS, RONALD;NICOLOSI, JOSEPH
分类号 G01N23/207 主分类号 G01N23/207
代理机构 代理人
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