发明名称 Method of making a trench capacitor and dram memory cell
摘要 A method of making a trench capacitor employs an N-type switchable plate formed in a P-type substrate for holding charge at either zero volts or a positive TC voltage and a P-type ground plate that fills in a trench around a memory cell, so that P-type dopant diffuses through a thin oxide insulator to form a channel stop and a pinhold short through the oxide is self-healing by the formation of a reverse-biased P-N diode that cuts off the flow of current through the pinhole.
申请公布号 US4679300(A) 申请公布日期 1987.07.14
申请号 US19850785195 申请日期 1985.10.07
申请人 THOMSON COMPONENTS-MOSTEK CORP. 发明人 CHAN, TSIU C.;HAN, YU-PIN
分类号 H01L27/04;H01L21/265;H01L21/266;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/94;(IPC1-7):H01L27/10 主分类号 H01L27/04
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