发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve reliability of etching, by utilizing a drop of resist produced by reaction heat at the time of etching and performing etching in which the etched material is made to taper. CONSTITUTION:An etched material 102 is formed on a wafer 101. A resist 103 is formed on the material 102. Patterning process is performed in the resist 103. With the patterning-made resist 103 as a mask, a drop of the resist 103 produced by reaction heat on etching is utilized to perform etching, in which the etched material 102 is made to taper. Hence, reliability of etching can be improved.
申请公布号 JPS62149136(A) 申请公布日期 1987.07.03
申请号 JP19850289892 申请日期 1985.12.23
申请人 SEIKO EPSON CORP 发明人 YOKOYAMA KENJI
分类号 H01L21/306;H01L21/302;H01L21/3065 主分类号 H01L21/306
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