| 摘要 |
PURPOSE:To attain a data transfer test with use of a large amount of data by using a means which produces automatically test data to transfer it to a logical device at the remote side and then transfers and supplies the test data through said logical device for inspection. CONSTITUTION:A test mode is set to a mode register 18 and a selection circuit 15 selects the test data 106 to transmit it as an input signal 110. A data counting register 16 transmits continuously the different data 106 until the contents of the register 16 are equal to 0. Thus a writing signal 102 is transferred to a main storage device via the circuit 15, an input buffer 11 and a data register 12. The test data is transferred in the form of a reading signal 100. This signal 100 is fetched as input data via a driver D, a receiver R and an input register 14. Then a coincidence circuit 15a compares the data 104 with the data 106 based on the comparison signal 108a for inspection of the transferred data 104. |
