发明名称 NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PURPOSE:To write memory transistors having different negative resistances and to obtain stable low power consumption by applying a predetermined current value to the drain electrode of an N-channel floating gate avalanche injection type MOS nonvolatile memory. CONSTITUTION:The drain electrode of a P-channel enhancement MOS transistor P1 having a source electrode as a power terminal 1, a gate electrode as a first control signal terminal 2 and the drain electrode as an output terminal 3 is connected with that of an N-channel enhancement MOS transistor Q2. The gate electrode is connected with the second control signal terminal 4, its source electrode is connected with the drain electrodes of N-channel floating gate avalanche injection type MOS nonvolatile memories M1-M3. The three gate electrodes are grounded to control signal terminals 5-7, the source electrode is grounded, the N-channel substrate electrode of the MOSP1 is connected with the power terminal, and P-channel substrate electrode Q2, M1-M2 are grounded.
申请公布号 JPS62145871(A) 申请公布日期 1987.06.29
申请号 JP19850288752 申请日期 1985.12.20
申请人 NEC CORP 发明人 KOYAMA KUNIAKI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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