Arrangement for testing RAMs

摘要

The invention concerns an arrangement for testing RAMs for correct working. The purpose of the invention is an arrangement for testing RAMs, on the principle of the double RAM with software comparison, which takes over the storing of the data in a way which is appropriate for the test, and thus relieves the program sequence of additional commands for this task. According to the invention, two RAMs are arranged in the arrangement, so that on writing to the first RAM the data is simultaneously inverted and written to the second memory at the inverted address. On reading, both RAMs must be addressed separately, and the inverted address of the second RAM must be taken into account by the central processing unit.