发明名称 AN ELECTRODE FOR A SEMICONDUCTOR DEVICE
摘要 <p>A semiconductor device includes an electrode having triple-layer electrode structure or a multilayer interconnecting structure comprising a contact (a lower conductive) layer (17) of aluminum or its alloy which comes into contact with a silicon substrate (1), a barrier (18) of refractory metal nitride (e.g. titanium nitride) and refractory metal (e.g. tungsten), and a (upper) conductive layer (19) of aluminium or its alloy. The TiN-W barrier layer (18) prevents over-dissolution of silicon into aluminum in spite of heat-treatment at a relatively elevated temperature.</p>
申请公布号 EP0127281(B1) 申请公布日期 1987.06.24
申请号 EP19840301991 申请日期 1984.03.23
申请人 FUJITSU LIMITED 发明人 WATANABE, KIYOSHI;TAKEUCHI, TOHRU;OHTAKE HIDEAKI;FUJITA, ICHIRO
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/52;H01L29/43;H01L29/45;(IPC1-7):H01L21/285;H01L29/40;H01L23/48;H01L21/60 主分类号 H01L21/28
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