发明名称 MICRO INCLINATION MEASURING APPARATUS
摘要 PURPOSE:To enable accurate measurement of micro inclination, by a method wherein the undersurface of a continuous member is abutted against the surface of an object to be measured, a rotary scale is turned on the pivot point and the graduation of the surface of sheet member is read with a leveler showing a horizontal position. CONSTITUTION:A contact plane of a continuous member 1 is abutted to the uppermost surface section of the circumferential surface portion of a pipe buried underground. Thereafter, a rotary scale 3 is turned by a desired angle on the pivot part and stopped when a leveler 4 mounted integral thereon 3 shows a horizontal position. Then, a reference line provided on the rotary scale 3 and a graduation 5 indicated on a sheet member arranged being piled at a position of back of the rotary scale 3 are read out from the surface of the see through rotary scale 3. Thus, the finest gradient can be measured accurately.
申请公布号 JPS62137513(A) 申请公布日期 1987.06.20
申请号 JP19850277999 申请日期 1985.12.12
申请人 ISHII KATSUMI 发明人 ISHII KATSUMI
分类号 G01C9/24 主分类号 G01C9/24
代理机构 代理人
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