Arrangement for influencing signals in optoelectronic measuring and monitoring instruments, preferably for sheet-like textile structures, threads and working elements on textile machines

摘要

The invention relates to the influencing of signals in optoelectronic measuring and monitoring devices which are used for detecting faults in sheet-like textile structures or the like. By means of the invention, the recognition reliability of optoelectronic monitoring devices and the quality of sheet-like textile structures and threads are to be increased. The light to be received by the receiver is to be influenced in such a way that the effect of disturbing fractions which are present is reduced. According to the invention, a plurality of slit diaphragms or a combination of slit diaphragms of differing width and/or length or of differing transparency of the transparent medium located in the slit are arranged in the beam path between the light source and receiver in a plane transverse to the beam path. The invention can be used in the textile industry in the production of sheet-like structures and threads and in the monitoring of working elements on textile machines.