| 发明名称 |
SELF-TESTING METHOD FOR LOGIC CIRCUITRY |
| 摘要 |
The LSSD scan paths on a number of logic circuit chips are modified and connected together in series to simultaneously serve as a random signal generator and data compression circuit to perform random stimuli signature generation. |
| 申请公布号 |
DE3371565(D1) |
申请公布日期 |
1987.06.19 |
| 申请号 |
DE19833371565 |
申请日期 |
1983.10.05 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BARDELL, PAUL HAROLD, JR.;MCANNEY, WILLIAM HOWARD |
| 分类号 |
G01R31/28;G01R31/317;G01R31/3185;G06F11/22;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
| 代理机构 |
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代理人 |
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| 地址 |
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