| 摘要 |
PURPOSE:To accurately test a delay time merely by displacing the position of a film carrier by arranging second and third pad groups substantially perpendicularly arranged in a moving direction of the carrier itself at a predetermined interval in one rows. CONSTITUTION:Second and third pad groups 7, 3 are connected with the output terminal of an integrated circuit chip 5, and a first pad group 4 is connected with a power source or an input terminal. The pad groups 7, 3 are so disposed at an interval that the interval of a pair of pads becomes a predetermined value (d) in a direction for moving a film carrier 1. After half (8) of output terminals of the chip 5 are connected with comparators and tested, the carrier 1 is displaced at the distance (d), pogopins are contacted with the pad group 7, and the remaining half output terminals (8) are connected with the comparators and tested. |
