| 摘要 |
PURPOSE:To attain miniaturization and cost reduction, by a method wherein the memory content of a first memory means is replaced with the count value of a flaw signal detection means at each time when a probe is changed over in synchronous relation to pulse repeating frequency and the peak value of the flaw signal stored by a second memory means is renewed. CONSTITUTION:A first memory means 5 stores the detection result of a flaw signal detection means (a reference signal generating circuit 1-a counter 4), which detects whether a flaw signal is a true one, with respect to each of a plurality of probes. A second memory means 11 stores a flaw signal having a max. peak value with respect to each of a plurality of probes. At each time when the probes are changed over in synchronous relation to pulse repeating frequency, the memory content of the first memory means is replaced with the count value of the flaw signal detection means. When the peak value of the detected flaw signal is larger than that of the flaw signal stored by the second memory means, the peak value of the latter is renewed and, further, a digital/analogue converter 14 outputs the flaw signal stored by the second memory means while converting the same to an analogue signal.
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