发明名称 APPARATUS FOR AUTOMATICALLY MEASURING ELECTRICAL CHARACTERISTICS OF SUBSTRATE
摘要 PURPOSE:To make it possible to rapidly determine the characteristics of a circuit, by a method wherein the adjustment knob of the adjustment element mounted on a substrate to be adjusted is moved with a predetermined step and each step position and the signal corresponding to said position are detected and displayed. CONSTITUTION:The rotary shaft of a resistor is stepwise revolved, for example, at an angular interval of 1 deg. by a pulse motor 10. By this operation, the revolving shaft of a variable resistor can be adjusted within a range of about 300 deg.. Further, in a microcomputer system 1, a means for successively storing each step position and the signal from the observation point, that is, a measuring signal at said position, in other words, the signal from an A/D converter 6, that is, a memory 19 is provided. Therefore, the information relating to each step position of the aforementioned variable resistor and the state of the signal at the measuring point to said step position (e.g., voltage) are stored in the memory 19. By this method, the information stored in the memory is displayed on a cathode ray tube 15 or a printer 16 or both of them if necessary.
申请公布号 JPS62134569(A) 申请公布日期 1987.06.17
申请号 JP19850276299 申请日期 1985.12.09
申请人 SONY CORP 发明人 KATO AKIHIKO
分类号 G01R31/02;H05K13/00 主分类号 G01R31/02
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