发明名称 Siliziumnitridmaskierung bei der Herstellung von mit Aluminium legierten Sperrschichtbauelementen
摘要 1,216,618. Semi-conductor devices. ITT INDUSTRIES Inc. 5 Aug., 1969 [12 Aug., 1968], No. 39087/69. Heading H1K. A method of manufacturing a Zener diode having an alloyed aluminium-silicon junction 11 comprises depositing a layer 7 of silicon nitride over the surface of an N-type conductivity silicon wafer 6, etching a window in this layer and depositing overall a layer 9 of aluminium, then heating to alloy the aluminium into the silicon through the window to form a P-type conductivity regrowth region 10. A plurality of such devices can be formed in one wafer, in' which case after the alloying step aluminium is removed from parts of the surface to leave a pattern of terminals and interconnecting strips. In a further embodiment, Fig. 6, not shown, a P-type conductivity region is formed initially in a silicon wafer through a window in a silicon dioxide masking layer, then a silicon nitride layer is formed overall having an aperture at the position of the window in the silicon dioxide layer and aluminium is deposited arid alloyed as before.
申请公布号 DE1932372(A1) 申请公布日期 1970.02.26
申请号 DE19691932372 申请日期 1969.06.26
申请人 DEUTSCHE ITT INDUSTRIES GMBH 发明人 RANJRAY MEHTA,RAJENDRA;PETER CAUGE,THOMAS;GEORGE SWANN,RICHARD
分类号 C08G73/20;H01L21/00;H01L21/24;H01L21/318;H01L23/485;H01L23/522;H01L27/00;H01L29/00 主分类号 C08G73/20
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