发明名称 RECRYSTALLIZING METHOD FOR CONDUCTOR FILM
摘要 PURPOSE:To selectively form a region in which a crystal grain boundary does not exist by interposing a thermal conduction control layer which is selectively increased in thickness on a region to be single crystallized between a conductor film and an energy beam absorbing layer to control a heat sink distribution in case of recrystallizing the conductor film. CONSTITUTION:A polycrystalline or amorphous conductor film 2 is formed on an insulating film 1, and a thermal conduction control layer 5 having a region 4 which is selectively increased in the thickness of the film on a region 3 to be formed with a recrystallized conductor film in which a crystal grain boundary does not exist of the film 2 is formed on the film 2. An energy beam absorbing layer 6 is formed on the control layer 5. An energy beam 7 is emitted to the layer 6 to raise the temperature of the layer 6, the film 2 is melted by conduction heat through the layer 5 from the layer 6 to be recrystallized. Since the recrystallization is proceeded from the lowest temperature portion of the center toward the periphery in the lower region of the thick region of the control layer, a recrystallized region in which a crystal grain boundary corresponding to the size of the region does not exist is formed on the lower portion of the thick region of the control layer.
申请公布号 JPS62132311(A) 申请公布日期 1987.06.15
申请号 JP19850272677 申请日期 1985.12.04
申请人 FUJITSU LTD 发明人 MUKAI RYOICHI
分类号 H01L21/60;C30B1/08;H01L21/20;H01L21/263;H01L21/268 主分类号 H01L21/60
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