首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
ATTACHMENT OF X-RAY REFRACTOMETER FOR STUDYING MONOCRYSTALS
摘要
申请公布号
SU1317341(A1)
申请公布日期
1987.06.15
申请号
SU19853898952
申请日期
1985.05.24
申请人
KI G UNIV IM.T.G.SHEVCHENKO
发明人
KULISH NIKOLAJ P,SU;MELNIKOVA NATALYA A,SU;MIRONENKO ARKADIJ I,SU;PETRENKO PETR V,SU;POROSHIN VITALIJ G,SU;UTENKOVA OLGA V,SU
分类号
G01N23/20
主分类号
G01N23/20
代理机构
代理人
主权项
地址
您可能感兴趣的专利
COATING MATERIAL FOR HEAT INSULATION
MANUFACTURE OF COLORED CEMENT ROOF TILE
CUTTING OF GLASS TUBE
PRECIPITATION OF TANTALUM OR NIOBIUM COMPOUND
ELECTRIC POWER CONTROLLER FOR ACTIVE CARBON REGENERATION
DETECTOR FOR RINSE OF WASHING MACHINE
GLASS COMPOSITION FOR FILAMENT
ULTRASONIC DIAGNOSIS APPARATUS
COUNTER FOR MAHJONG SCORE
ELECTRIC CLEANER
ELECTRIC CLEANER
PROPANOLAMINE DERIVATIVES
3-AMINOPROPOXYPHENYL DERIVATIVES
PHENYLETHANOLAMINES
IMIDAZOLINE DERIVATIVES FOR TREATMENT OF DIARRHOEA
MANUFACTURE OF BUTADIENE-PROPYLENE ALTERNATE COPOLYMER
PATRONUDKASTER TIL SKYDEVAABEN FOR HYLSTERLOESE PATRONER MED RUNDTGAAENDE FAENGLADNING
UTKASTARE VID ELDVAPEN FOR SJELVDRIVANDE, HYLSLOSA PROJEKTILER MED RUNTOMGAENDE TENDHATT
REGLERINGSANORDNING ANSLUTEN I SERIE MED EN HUVUDLINDNING HOS EN TRANSFORMATOR
SEMICONDUCTOR DEVICE