| 摘要 |
<p>PURPOSE:To enable the infrared spectrum of the uppermost surface layer of a specimen to be measured by bringing the evaporated film for an infrared total reflection that is formed on the infrared ray reflecting surface of a prism into close contact with the specimen and measuring a total reflection infrared spectrum. CONSTITUTION:A specimen 3 is disposed in a specimen chamber 4 and a prism 1 is brought into close contact with the specimen 3 via an evaporated film 2. Infrared rays 6a from a light source 6, after being modulated by a Michelson interferometer 5, enter into the prism 1 in the specimen chamber 4 via one end surface of the prism 1. Then, a reflection is repeated several times between the evaporated film 2 and an upper surface opposite thereto. Thereafter, the infrared rays 6a are emitted to outside from the other end surface of the prism 1 and reflected by two reflecting mirrors 7 to enter a detector 8. Signals from the detector 8 are arithmetically processed by a Fourier transformation processor 9. Thus, not only a good infrared spectrum is obtained but also, by increasing the thickness of the evaporated film 2, only the uppermost surface layer of the specimen 3 can be measured.</p> |
