发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a minute electrode pattern simply by using a single resist layer, by coating a dielectric film on a substrate having stepped structure, and selectively performing anisotropic etching of a region including a step part. CONSTITUTION:In a GaAs crystal substrate 1, recess etching is performed. An SiO2 dielectric film 2 is applied on the substrate by a chemical vapor deposition method. Resist 3 is applied on the substrate. A hole is provided in the resist including a step part of the dielectric film 2. With the resist pattern as a mask, the dielectric thin film 2 undergoes reactive ion etching, and a metal electrode 4 is formed by a lift-off method. Thus a recess structure is provided, the length of a gate can be shortened and the distance between a source and a drain can be also shortened.
申请公布号 JPS62131584(A) 申请公布日期 1987.06.13
申请号 JP19850271465 申请日期 1985.12.04
申请人 HITACHI LTD 发明人 MITANI KATSUHIKO;TAKAHASHI SUSUMU;OKAZAKI SHINJI;YANAGISAWA HIROSHI;ONO RYOICHI;URYU TAKESHI
分类号 H01L21/28;H01L21/338;H01L29/80;H01L29/812 主分类号 H01L21/28
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