发明名称 TESTING SYSTEM FOR CLUSTER TYPE CONTROLLER
摘要 PURPOSE:To automatically and efficiently test a cluster type controller by bisecting a cluster type controller into master side and slave side and realizing testing state of optional mode such as various states of error, the state to operation of an operator, complicated state of contention etc. artificially. CONSTITUTION:A cluster type controller 100 is bisected into master side 110 and slave 120 and the master side 110 is made to function as a cluster type controller and the slave side 120 is made to function as a pseudo-device. By emulating various modes of pseudo-devices by a pseudo-device emulation processing section 13B of the slave side 120, optional state of test such as various states of error, the state of operation of an operator, complicated state of contention etc. can be realized artificially and the cluster type controller 100 can be tested automatically and efficiently. Emulation of these pseudo- devices can be realized by the pseudo-device emulation processing section 113B, that is, an MPU 113 using software.
申请公布号 JPS62127945(A) 申请公布日期 1987.06.10
申请号 JP19850268518 申请日期 1985.11.29
申请人 FUJITSU LTD 发明人 GOTO YUICHI
分类号 G06F11/22 主分类号 G06F11/22
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