| 摘要 |
Apparatus for testing the electrical integrity of a printed circuit board under test (BUT) (12) having a plurality of accessible nodes at predetermined locations on its bottom surface, includes means for supporting the BUT, a support board 29 mounted parallel to the BUT on the same side of the BUT as the accessible nodes, a plurality of test pins (30) carried by the support board at locations corresponding to possible locations for the accessible nodes, the test pins having contacting portions on one side of the support board for contacting the nodes and actuating portions on the other side of support board to cause the contacting portions to be moved into an actuated position for contacting the nodes when the actuating portions are displaced, and an actuating board parallel to the support board and having displacement portions (57) aligned with selected actuating portions corresponding to the predetermined BUT locations to displace those test pins that correspond to the nodes at predetermined locations of the BUT. <IMAGE> |
