发明名称 COLD HEAT ENVIRONMENT TESTING DEVICE
摘要 PURPOSE:To reduce a running cost and decrease a time ranging from a hot test temperature to a cold test temperature by a method wherein a heater integrally formed with an evaporator of a cascade two-component freezing cycle is arranged in a low temperature room and hot gas of freezing cycle is introduced into the heater. CONSTITUTION:Within a low temperature room 2 are integrally arranged an evaporator of a freezing cycle composed of a second compressor 250, a cascade heat exchanger 240, a second expansion valve 260 and a second solenoid valve, and a heater 13 having hot gas of a freezing cycle A composed of a first compressor 210, a condensor 220, a first expansion valve 230 and a cascade heat exchanger 240. When the low temperature room 2 is reached to a desired temperature, a damper for a test room is opened to start a heat shock test. A test piece in the test room is cooled in reference to a temperature sensor. When the test room in reaches in a desired temperature, the first solenoid valve 300 in a hot gas return system 290a is controlled with a signal from the temperature sensor, coolant gas in the first compressor 210 is flowed into a temperature adjusting heater 13 to heat the air end adjust the air temperature. Integral construction of the evaporator within the low temperature roo causes a calorie in the low temperature room to be increased and a temperature time reached from a hot temperature test to a low temperature test can be reduced.
申请公布号 JPS62125230(A) 申请公布日期 1987.06.06
申请号 JP19850264773 申请日期 1985.11.27
申请人 HITACHI LTD 发明人 SHIMIZU MASASHI;FUKUSHIRO TAKESHI
分类号 F24F5/00;G01N17/00 主分类号 F24F5/00
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