发明名称 SURFACE INSPECTION DEVICE
摘要 PURPOSE:To detect a defect with high precision by removing the component of diffracted light due to the flaw of surface polishing from receiving light through a space filter by the 1st optical system. CONSTITUTION:When the kind of a body to be inspected is specified and specification information on the object of inspection is read in form a console panel 170, a turn-on instruction for a clutch 112 is outputted to a driving circuit 164 to turn on the clutch 112 if the object of inspection which is polished linearly in one direction is specified. Then, a driving circuit 166 drives motors 32 and 33 to start a spiral scan on the surface of the object of inspection. The 1st optical system is provided with the space filter and removes the component of diffracted light due to a flaw of polishing. The code of a defect decision signal is 00 when there is no defect at the scanning point, 01 when there is a projection defect, and 01 when there is a recessed defect; and it is counted by counters N, N1, and N2 and when the counted values are all below a decision threshold value, acceptance is displayed on the console panel 170.
申请公布号 JPS62124448(A) 申请公布日期 1987.06.05
申请号 JP19850265331 申请日期 1985.11.26
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 NARA KEI;HOURAI IZUO
分类号 G01N21/88;G01B11/30;G01N21/95;G01N21/956;G11B5/84;G11B7/26 主分类号 G01N21/88
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