发明名称 JIG FOR TEST HEAD
摘要 PURPOSE:To obtain a test head use jig which can be attached and detached to and from a test head, by clamping and fixing an IC socket board to a spring pin contact member, through a holding plate between a clamping body and the IC socket board. CONSTITUTION:When attaching and detaching a test head use jig 100 to and from a test head 10, when the tip of a guide post 132 is aligned with a guide post receptacle 16 and a spring contact ring 102 is depressed, the guide post 132 is fitted into the receptacle 16. A relation position of the ring 102 and a contact board 14 is aligned correctly, and the lower end of the ring 102 and a contact of the board 14 corresponding to it contact each other. Subsequently, a fitting screw 134 is turned by a lug part 134A, a screw part 134B is screwed into a fitting screw hole 16B, and the ring 102 is fixed to the board 14. A holding ring 106 is detained to a supporting plate 113 by a notch, therefore, it does not rotate when a clamping ring 108 is rotating. In such a way, the jig 100 which can be attached and detached to and from the head 10 can be obtained.
申请公布号 JPS62121377(A) 申请公布日期 1987.06.02
申请号 JP19850261749 申请日期 1985.11.21
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 IZUMI TOSHIO
分类号 G01R31/28 主分类号 G01R31/28
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