| 摘要 |
PURPOSE:To eliminate an erroneous diagnosis caused by a contact failure of a probe pin by small man-hour and time, by welding with pressure again a package to be tested and a probe pin group, if there is a part which is decided to be defective by a package test by using the first in-circuit tester, and re- testing only a part which is decided to be defective by the previous test. CONSTITUTION:Many of contact failures of a probe pin 6 are generated at random, and the probability that the same pin 6 causes repeatedly the contact failure is small. Therefore, after the first package test is ended, if there is a part which is decided to be defective, its package to be tested 7 and a probe pin group 6 are welded with pressure again, and only a part which is decided to be defective by the previous test is re-tested. In such a way, even if there if the pin 6 which has caused the contact failure by the previous test, a normal contact of its pin can be expected in case of the re-test, the number of pins 6 related to the re-test decreases, and the contact failure of other pin is not influenced by a result of the test. Accordingly, an erroneous diagnosis caused by the contact failure of the pin 6 is eliminated automatically by small man-hour and time.
|
