| 摘要 |
<p>Assembly for measuring the transverse thickness profile of a product. A stationary radiation source 10 is situated on one side of the product and is associated with a collimator 12 arranged so as to produce a beam which diverges in a direction which is transverse with respect to the product, in order to intercept this beam on the part of the profile to be measured, and a detection device 20 extends transversely with respect to the product, on the other side of the product and includes at least one row of juxtaposed elementary detectors which each produce a signal which is a function of the quantity of radiation received, a processing circuit receiving the signals from the detectors in order to produce data representing the profile sought. The field of application is more particularly the measurement of the thickness of flat products moving along, such as hot or cold laminated strips. <IMAGE></p> |
