发明名称 X-RAY EXPOSING APPARATUS
摘要 PURPOSE:To obtain an X-ray exposing apparatus which is set to a fine level lower than a vibration elimination by separating a mask, a wafer to be eliminated for vibration and a rotary target, a motor and a pump and constructing to maintain a vibration eliminating base of the wafer, mask and a vibration elimination base of a beam source at a predetermined distance so that an X-ray range can follow the vibration of the base after the movable base is moved, thereby minimizing the X-ray range as required. CONSTITUTION:A mask 20, a wafer 21 and a movable base 22 are mounted on a vibration eliminating base 23 supported by legs 25a to a floor 26, a vibration eliminating base 28 supported by legs 25b to the floor 25 is composed of angles surrounding the base 23, beams 29a, 29b, 29c are stood on the base 28, a rotary target 12, a motor 13 for rotating the target and a pump 15 are mounted. A length measuring unit 31a is moved at a distance in X direction to the base 23, and a length measuring unit 31b is moved at a distance in Y direction in a predetermined accuracy by a non-contacting length measuring unit to move the base 29 by drivers 30a, 30b mounted on the legs 25b.
申请公布号 JPS62120026(A) 申请公布日期 1987.06.01
申请号 JP19850260313 申请日期 1985.11.20
申请人 FUJITSU LTD 发明人 WATANABE YOSHIO
分类号 H01L21/68;G03F7/20;H01L21/027;H01L21/30;H01L21/67 主分类号 H01L21/68
代理机构 代理人
主权项
地址