发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To convert a polycrystalline silicon film containing oxygen into a film fit for a surface protective film by a method wherein the polycrystalline silicon film containing high percentage of oxygen produced by chemical reaction of SiH4 and N2O in nitrogen atmosphere is heat-treated in nitrogen atmosphere containing steam. CONSTITUTION:A P-type base region 2, an N<+> type emitter region 3 and N<+> type collector electrode regions 4 are formed on an N-type silicon substrate 1. Next, an SiO2 film 5 is removed leaving parts thereof on the emitter region 3 and the emitter.base regions 2, 3. Then a polycrystalline silicon film 6 containing 20-30% of oxygen is formed on overall surface. This polycrystalline silicon film is formed by chemical reaction of SiH4 and N2O in nitrogen atmosphere. Further, the silicon substrate 1 containing the polycrystalline silicon film 6 is heat-treated in a furnace at a temperature exceeding 800 deg.C. Through the heat-treatment, an SiO2 film of around 0.08mum thick is formed to provide the polycrystalline silicon film with high resistance.
申请公布号 JPS62118531(A) 申请公布日期 1987.05.29
申请号 JP19850258975 申请日期 1985.11.19
申请人 MATSUSHITA ELECTRONICS CORP 发明人 YAMAZAKI AKIRA;KAWASAKI HIDEO;YOKOZAWA MASAMI
分类号 H01L21/316 主分类号 H01L21/316
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