发明名称 RESIST HARDENING DEVICE
摘要 PURPOSE:To produce a semiconductor with resist corner shape finished sharply and evenly by a method wherein a wafer coated with resist is successively heated to be irradiated with ultraviolet rays later. CONSTITUTION:When a wafer W is carried to a hot plate 10, an electromagnetic valve 15a is opened to start a vacuum pump 15. When a vacuum vessel 4 reaches the specified degree of vacuum thereby, another electromagnetic valve 16b is opened to feed the vacuum chamber 4 with nitrogen gas. Later the plate 10 lowered down to a cold plate 11 is lifted up to the middle step position by actuating a cylinder 9. On the middle step position, the hot plate 10 is preheated by a heating coil 10a. Later the hot plate 10 is lifted up to the upper step position where a shutter 19a is driven by a motor 19 to be opened for irradiating the wafer W with UV rays 5a. Further, the hot plate 10 is heated up to higher temperature by the heating coil 10a. When the resist coated on the wafer W is hardened,the hot plate 10 is lowered down to the original position to take the wafer 10 outside.
申请公布号 JPS62118527(A) 申请公布日期 1987.05.29
申请号 JP19850257808 申请日期 1985.11.19
申请人 TOSHIBA CORP 发明人 KOIKE HIROSHI;KIMOTO TOSHIHARU
分类号 G03F7/00;G03F7/38;H01L21/027;H01L21/30 主分类号 G03F7/00
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