发明名称 Contact arrangement
摘要 An improved contact arrangement which can be used, for example, in test devices for quality testing or burn-in testers has sprung, self-cleaning contacts which are constructed as leaf springs with a rectangular cross-section, and has a sprung ejector which, centred by the contacts, is used as a position holder for the respective component which is to be tested. The use of the contacts as a Kelvin contact-making device is possible. The contact arrangement can be connected to the test devices by means of a baseplate which is constructed to be gas-tight and dustproof.
申请公布号 DE3541251(A1) 申请公布日期 1987.05.27
申请号 DE19853541251 申请日期 1985.11.21
申请人 HEIGL,HELMUTH,DR.-ING. 发明人 HEIGL,HELMUTH,DR.-ING.
分类号 G01R31/28;(IPC1-7):H01R33/76;H01R13/02 主分类号 G01R31/28
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