Sensitivity-calibration circuit for absorption analyzers.

摘要

The sensitivity-calibration circuit for absorption analyzers comprises two separate temperature-compensation circuits (A, B), one (A) for compensating the temperature-drift resulting from the optical system of the analyzer and the other one (B) for compensating the temperature-drift caused by a sample system of the analyzer. The latter mentioned temperature-compensation circuit (B) can be blocked-off from operating on a checking and/or measuring input signal (VIN) by use of a switch (SW) such that during a measuring state both temperature-compensation circuits (A, B) are cooperating in sequence whereas during a specific checking state by switching over switch (SW) only said temperature-compensation circuit used in connection with checking the optical system is actively operating on said input signal (VIN). The advantage over the prior art combination sensitivity-calibration circuits is a more accurate and reliable calibration of the absorption analyzer during both, the measuring state and the checking state of the whole system.