| 摘要 |
A thin film for recording data which is formed on a substrate directly or via a protection layer, and which develops change in the arrangement of atoms upon irradiation with a recording beam, wherein an average composition in the direction of film thickness is represented by the general formula, AXBYCZD alpha E beta wherein X, Y, Z, alpha and beta are values that lie over the ranges of 0</=X<30, 0</=Y</=40, 0</=Z</=70, 15</=Y+Z</=70, 10</= alpha </=65, 20</= beta </=70, E denotes at least one element between Se and S, D denotes at least one element among As, Sb, Si and Ge, C denotes at least one element among Bi, Sn and Pb, B denotes at least one element among Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Ru, Co, Rh, Ni and Pd, and A denotes an element or elements other than those elements denoted by E, D, C and B.
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